Objective: To analyze X-ray diffraction (XRD) and Raman spectrum fingerprint characteristics of Fluoritum

and to provide a reference for its fast and effective identification. Method: XRD was used to determine phase composition and the content of CaF2 from Fluoritum

Calcite and Quartz with Cu target Kα radiation as incident light source

filter of Ni

40 kV as X-ray tube voltage

40 mA as the current

1 degree as divergence slit (SD) and scattering slit (SS)

0.3 mm as receiving slit.On this basis

Raman spectrum characteristics of Fluoritum in the range of 61-2 695 cm-1

with 785 nm as wavelength of excitation light source

300 mV as laser power

1.5 m optical fiber probe and laser intensity of 100%. Result: Analysis of XRD indicated that samples 1-15 were Fluoritum

samples 16-20 were adulterants and sample 21 was counterfeiter.Fluoritum had 3 groups of characteristic peaks of Raman spectrum in the range of 310-325

720-1 500

1 700-1 900 cm-1

which can be used to identify its authenticity. Conclusion: XRD can accurately determine phase composition of Fluoritum

which provides original sample data to identify Fluoritum by Raman spectrum.As a way of fast analysis technology

Raman spectroscopy has good specialization

it can identify Fluoritum and its adulterants

counterfeiters.